Electron Backscatter Diffraction (EBSD)
Electron Backscatter Diffraction (EBSD) enables characterisation of the microstructures of crystalline samples, by acquiring and automatically indexing electron backscatter (Kikuchi) patterns. With their high-intensity field-emission electron sources, ISAAC’s SEM’s can acquire and index tens to hundreds of Kikuchi patterns per second, so that high-resolution EBSD maps can be produced in minutes.
ISAAC is almost unique in the UK with its two integrated EDX-EBSD systems, an EDAX-TSL system on the FEI Quanta SEM and an Oxford-HKL system on the Zeiss Sigma SEM.
